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ID28 - Inelastic Scattering II

Synopsis

ID28 is dedicated to the study of phonon dispersion in condensed matter at momentum transfers, Q, and energy transfers, E, characteristic of collective atom motions. Main activities comprise the study of disordered systems and samples only available in very small quantities (<<1 mm^3v) and/or submitted to very high pressures (100 GPa and beyond).
Status:  open

Disciplines

  • Physics
  • Earth and Planetary Sciences
  • Materials and Engineering
  • Life Sciences

Applications

  • Physics (correlated electron systems, liquid and glass dynamics)
  • Earth and planetary science

Techniques

  • IXS - inelastic X-ray scattering
  • GID - grazing incidence diffraction

Energy range

  • 13.48 - 25.8  keV

Beam size

  • Minimum (H x V) : 20.0 x 10.0  µm²
  • Maximum (H x V) : 300.0 x 60.0  µm²

Sample environments

  • Low temperature (2K)
  • High temperature (1500K)
  • High pressure (up 1 Mbar and beyond)
  • UHV chamber (for liquid surface studies)

Detectors

  • Silicon pin diodes
  • Customised CCD detector for single crystal alignment
  • MAR CCD (from loan pool)
  • Pilatus 300K-W (from loan pool)

Technical details

The beamline permits inelastic x-ray scattering studies from collective ion excitations/phonons. MAIN BEAMLINE CHARACTERISTICS are as follows: Incident photon energy: 13840, 15817, 17794, 21747 and 23725 eV; energy resolution of 7.0, 5.5, 3.0 and 1.5 meV; energy transfer: 0-400 meV; focal spot size: 250 x 70μm2 or 14 x 10μm2; horizontal x vertical, FWHM; momentum resolution: typically 0.03 nm-1 (can be further improved by slits); momentum transfers from 1-100 nm-1; nine momentum transfers are recorded simultaneously. EXPERIMENTAL OBSERVABLES are the following: phonon dispersion, sound velocities, elastic constants, phonon density of states (and derived thermodynamic properties such as specific heat, entropy, Debye temperature and velociy, etc.)

[1] M. Krisch and F. Sette, "Inelastic X-Ray Scattering from Phonons", in Light Scattering in Solids, Novel Materials and Techniques, Topics in Applied Physics 108, 317-369, Springer-Verlag Berlin Heidelberg (2007). [2] A. Bosak, I. Fischer, and M. Krisch, "Phonon spectroscopy of polycrystalline materials using inelastic x-ray scattering", in Thermodynamic Properties of Solids. Experiment and Modeling, Eds. S.L. Chaplot, R. Mittal, N. Choudhury. Wiley-VCH Verlag Weinheim, Germany (2010).