Synchrotron X-ray diffraction and computed tomography for 3D materials science

Start Date
10-03-2020 14:00
End Date
10-03-2020 15:00
Room 500 - 501, Central Building
Speaker's name
Speaker's institute
INP-Toulouse/AMVALOR Metz
Contact name
Eleanor Ryan
Host name
Alexander RACK
Add event to calendar
iCal | vCal

Synchrotron sources have facilitated the collection of three-dimensional data volumes by X-ray diffraction (XRD) and computed tomography (CT), and have become powerful tools for materials science. These techniques allow us to study samples and processes that are otherwise very difficult to observe by 2D surface techniques, and provide information about the bulk of the material. They are especially well-suited for experiments performed under in-situ sample conditions (heating, electric field, loading, etc.), allowing the quantification of structural evolution over time. In addition to insight gained from the experiments themselves, the 3D data have been highly valued as input to simulations, not only improving materials models but also giving insight into the coupling of phenomena across length-scales that are very difficult to measure simultaneously. As such, diffraction and tomography are key tools for a multi-scale understanding of materials behaviour and how it evolves.

Far- and nearfield 3D X-ray diffraction scans provide information on grain position, orientation, and elastic strains in polycrystalline samples, and can be used to study, for example, crystallographic phenomena such as deformation twinning and domain switching, often in combination with crystal plasticity models that reveal inter- and intragranular effects. XRD techniques, however, are typically not well suited to study heavy deformation and other features occurring at the micrometer length scales, such as fibres, fractures, and the shape and distribution of pores and precipitates. Here, absorption and phase contrast tomography offer complementary information and likewise enable tracking of the sample evolution under in-situ conditions. The development of particle tracking and digital volume correlation software now allows for the extraction of 3D strain fields from imaging results, revealing the spatial variation in bulk materials response. These studies help identify and explain the factors that determine how components respond during manufacturing, in-service, and leading up to failure, and how to better control and improve them.

In this talk I will present previous studies using 3DXRD techniques to investigate the relationship between microstructure and response in polycrystalline materials. Further, I will explore X-ray microtomography as a complementary tool to extract quantitative information about materials behaviour, and it’s applications to interesting characterisation problems in nuclear materials and novel high entropy alloys.

Visitors from off-site please contact Eleanor Ryan tel +33 (0)438881992 to arrange for a gate pass.
Requests made by e-mail will be confirmed.
If you do not receive a confirmation e-mail, please contact us by phone.