Towards full Silicon Carbide based x-ray beam monitoring

QUICK INFORMATION
Type
Seminar
Start Date
03-06-2019 14:00
End Date
03-06-2019 16:00
Location
Auditorium, Central Building
Speaker's name
Massimo Camarda
Speaker's institute
Paul Scherrer Institut
Contact name
Fabienne Mengoni
Host name
P. Fajardo
Add event to calendar
iCal | vCal

In 2017, PSI started a research activity to develop x-ray beam position monitors (XBPM) based on Silicon Carbide thin membranes.  Original goal of the project was to resolve material limits associated to polycrystalline diamond based XBPMs like low yields, low uniformities, and poor electrical responses in terms of time resolution and amplitude of the signal.

In these two years of development the original goal greatly enlarged, encompassing novel beam monitoring applications, beyond those of both polycrystalline and single crystal diamonds.

During the presentation a complete overview of the current status of the activity will be given, focusing not only on well-established fields like monochromatic hard x-ray beam monitoring, with several established and planned installations, but also on novel applications: monitoring of (i) transmitted, (ii) polychromatic (pink and white beams) and (iii) soft x-ray beams, compact dosimeters, near-sample monitors and more.

Visitors from off-site please contact Fabienne Mengoni tel +33 (0)4 76 88 20 44 to arrange for a gate pass.
Requests made by e-mail will be confirmed.
If you do not receive a confirmation e-mail, please contact us by phone.